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Wafer-level light-emitting device measurement system for VCSEL/LED

Various electrical and optical properties can be measured at the wafer level!

Synergy Opto Systems Co., Ltd.'s "Wafer-Level Light Emitting Device Measurement System for VCSEL/LED" is a system for analyzing light-emitting devices such as VCSELs and LEDs in wafer form. By combining various measuring instruments, it is possible to construct a system that measures various electrical and optical characteristics of light-emitting devices at the wafer level. Depending on customer specifications, we can accommodate the selection of probers, customization of measurement optical systems, and measurement software. We also have a wafer-level light-receiving device measurement system that can measure the electrical and optical characteristics of light-receiving elements such as photodiodes in wafer form. 【Features】 ■ Compatible with various probers ■ Capable of proposing an integrated measurement environment through combinations with various measuring instruments *For more details, please refer to the catalog or feel free to contact us.

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  • Element measurement system

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